Understanding the relationship between crystal structure and emergent quantum phenomena requires high-quality structural characterization across multiple length scales. In this work, we demonstrate how advanced laboratory X-ray diffraction techniques can be employed to investigate a range of quantum materials, including kagome magnets, e.g., HoMn6Sn6, topological materials, e.g., Te, Mg3Bi2, and low-dimensional crystals, WSe2, MoS2, etc. Using a high-resolution Rigaku SmartLab diffractometer equipped with multiple monochromator configurations and complementary X-ray analytical techniques, we performed phase identification, crystallographic orientation analysis, reciprocal space mapping, and structural refinement on single crystals and thin films.
The measurements reveal subtle structural features that are closely associated with magnetic and electronic properties, including lattice distortions, crystalline qualities, defect levels and mosaic spreads. By combining high-resolution X-ray diffraction with low-temperature transport and magnetic characterization, we establish clear correlations between crystal structure and functional behaviour. Representative case studies demonstrate the capability of laboratory X-ray techniques to support the development of emerging quantum materials and devices.