Oral Presentation Crystal36-AXAA Conference 2026

Application of a liquid metal jet x-ray source for multiscale materials characterisation (145317)

Peter A Lynch 1 , Owen Solly 1 , John Gionis 1 , David Fox 1 , Jun Wang 1
  1. Deakin University, Waurn Ponds, VIC, Australia

The rapid evolution of advanced manufacturing technologies demands a parallel advancement in material characterization techniques. Multi-modal X-ray characterization offers significant potential to accelerate materials development by rapidly establishing links between material microstructure and mechanical performance. In this context, multi-modal studies are enabled by the unique capabilities of a liquid metal jet X-ray source to characterize materials across a broad range of length scales. An integrated suite of complementary laboratory-based X-ray techniques has been developed, including:

  1. Small-angle X-ray scattering (SAXS) for probing nanoscale structural features.
  2. Three-dimensional X-ray diffraction (3DXRD) for mapping crystallographic microstructures.
  3. High-resolution X-ray micro-computed tomography (Micro-CT) for non-destructive three-dimensional imaging of internal structures.

Together, these techniques provide a comprehensive characterization pathway spanning multiple length scales, enabling rapid and correlated assessment of material structure and properties. A series of illustrative case studies demonstrates the transformative potential of this laboratory-based, multi-modal X-ray characterization capability for accelerating materials research and development.