Abstract:
Recent developments in wavelength-dispersive X-ray fluorescence (WDXRF) are increasingly driven by advances in detector technology and signal processing rather than excitation and optics alone. Higher count rates, wider concentration ranges, and more flexible quantification strategies place new demands on detector linearity, spectral stability, and background modeling.
This presentation highlights key innovations in modern WDXRF detectors and signal processing, focusing on their impact on spectral quality at high intensities. Improvements in linearity, background reduction, and pulse-height stability are discussed in the context of challenges such as pulse pile-up, escape peaks, and dead-time effects.
The results of these advances for quantitative analysis are outlined, including their role in enabling robust custom calibrations and standardless (FP-based) approaches. Examples illustrate how improved detector performance and signal processing provide the spectral quality required for reliable full-spectrum modeling, reduced dependence on matrix-matched standards, and shorter measurement times.