Thomas Degen
Dr. Thomas Degen is a Scientist in the XRD R&D group at Malvern Panalytical in Almelo, The Netherlands. He obtained his Ph.D. in Solid-State Chemistry from the University of Bonn, Germany. His work focuses on algorithms, software development, and advanced data analysis methods for X-ray powder diffraction (XRPD), including Rietveld refinement, pair distribution function (PDF) analysis, machine learning, clustering, and workflow automation. With more than 30 years of experience in diffraction data analysis, Thomas has contributed to the development of the HighScore software suite and is actively involved in advancing automated and AI-assisted approaches for crystallographic and materials characterization.
Abstracts this author is presenting:
