Ian C. Madsen
Ian Madsen has in excess of 57 years' experience in X-ray analysis which includes XRF and both X-ray powder and single-crystal diffraction.
His research interests include:-
Accuracy in powder diffraction, especially for applications using quantitative phase analysis (QPA).
The optimisation of data-collection strategies for powder diffraction analysis, particularly whole-pattern, Rietveld-based methods.
Science under extreme conditions. Ian has had a long involvement with studies which aim to measure the structural changes taking place under extreme conditions (temperature, pressure, pH etc..), especially those which emulate conditions found in mineralogical processing plants.
He is author or joint author of >100 research papers and 8 book chapters including Chapter 3.9 - Quantitative Phase Analysis in the International Tables for Crystallography, Volume H – Powder Diffraction.
Ian was a long-serving member of (i) AXAA’s National Council, including serving as its president, and (ii) the International Union of Crystallography (IUCr) Commission on Powder Diffraction (CPD).
In February 2008, Ian was the inaugural recipient of the AXAA Bob Cheary Award for Excellence in Powder Diffraction. He was inducted as a Life Member of the AXAA in 2015.
Abstracts this author is presenting: